← Mathematical compendium

Published equation contexts

Cpk=min⁡(USL−μ3σ, μ−LSL3σ)C_{pk} = \min\left(\frac{\mathrm{USL} - \mu}{3\sigma},\ \frac{\mu - \mathrm{LSL}}{3\sigma}\right)

Why this formula appears here

The oldest tool for doing this is the control chart, and it works by testing a sequence of measurements against known patterns rather than against a single pass/fail threshold. The classic Western Electric decision rules flag a process as suspect if, for example, a single point lands more than three standard deviations from the target, or two of three consecutive points land beyond two standard deviations, or a long run of consecutive points falls on the same side of the target line — patterns that are each individually unlikely under normal random variation and therefore signal that something about the process, not the sample, has changed [ 10 ] . Alongside the chart sits a single summary…

Read the full article-specific guide →

Read the representative guide

σ\sigma

Symbol σ

σ occurs below the fraction bar. The quantity above the bar is divided by this expression; zero is excluded as a denominator.

Read this term in its guide →

How to interpret it

With a fixed numerator, increasing a nonzero denominator reduces the fraction. Read it with the definitions, units, and assumptions supplied by the article.

Research cited beside this formula

Published contexts (1)

A symbol can carry a different meaning in another article. Each occurrence keeps its own guide and term definitions.

Cpk=min⁡(USL−μ3σ, μ−LSL3σ),C_{pk} = \min\left(\frac{\mathrm{USL} - \mu}{3\sigma},\ \frac{\mu - \mathrm{LSL}}{3\sigma}\right),

Equation 12 · Semiconductors

How Advanced Semiconductor Fabrication Actually Works

This equation states an equality: the expressions on both sides have the same value under the article’s assumptions.

The oldest tool for doing this is the control chart, and it works by testing a sequence of measurements against known patterns rather than against a single pass/fail threshold. The classic Western Electric decision rules flag a process as suspect if, for example, a single point lands more than three standard deviations from the target, or two of three consecutive points land beyond two standard deviations, or a long run of consecutive points falls on the same side of the target line — patterns that are each individually unlikely under normal random variation and therefore signal that something about the process, not the sample, has changed [ 10 ] . Alongside the chart sits a single summary…

Equation guide → · Article →