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Equation 12 · Part 1 · How Advanced Semiconductor Fabrication Actually Works

Symbol C_pk

Cpk=min⁡(USL−μ3σ, μ−LSL3σ),C_{pk} = \min\left(\frac{\mathrm{USL} - \mu}{3\sigma},\ \frac{\mu - \mathrm{LSL}}{3\sigma}\right),
CpkC_{pk}

What this part means

CpC_pk is the quantity selected or evaluated by the optimization written on the right.

Its job in the formula

CpC_pk is the quantity selected or evaluated by the optimization written on the right.

The passage around this formula

…summary number, the process capability index, Cpk=min⁡(USL−μ3σ, μ−LSL3σ)C_{pk} = \min\left(\frac{\mathrm{USL} - \mu}{3\sigma},\ \frac{\mu - \mathrm{LSL}}{3\sigma}\right). comparing the distance from the process mean μ\mu to its nearer specification limit against three standard deviations of the process’s own spread. A CpkC_{pk} at or above about 1.33 is generally treated as acceptable capability, 1.67 or above as excellent, and below 1.0 as a process that cannot reliably meet its own specification even when perfectly centered [ 10 ] . The index does one specific job: it converts “how tight is this distribution” and…

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A subscript is a label attached below a symbol. It often selects a time step, component, category, or member of a sequence.

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Sources cited in the surrounding passage

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