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Published equation contexts

Y(A)=(1+D0Ac)−cY(A) = \left(1 + \frac{D_0 A}{c}\right)^{-c}

Why this formula appears here

The second ceiling is statistical and softer, but it bites earlier. Defects arrive on a wafer at some density, and the probability that a given die contains none of them falls as its area grows. Feng and Ma, in the cost model they published for multi-chiplet architectures, use the negative binomial form Y(A)=(1+D0Ac)−cY(A) = \left(1 + \frac{D_0 A}{c}\right)^{-c}. with defect density D0D_0 , die area A , and a clustering parameter c that captures the fact that defects are not independently scattered [ 2 ] . The exact parameters matter less than the shape. Yield falls monotonically with area, so cost per good die rises faster than area, and past some size the marginal square millimetre costs more than the function printed on it is…

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cc

Symbol c

c occurs below the fraction bar. The quantity above the bar is divided by this expression; zero is excluded as a denominator.

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With a fixed numerator, increasing a nonzero denominator reduces the fraction. Read it with the definitions, units, and assumptions supplied by the article.

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Published contexts (1)

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Y(A)=(1+D0Ac)−c,Y(A) = \left(1 + \frac{D_0 A}{c}\right)^{-c},

Equation 1 · AI Hardware & Semiconductors

When the Substrate Became the Product

This equation states an equality: the expressions on both sides have the same value under the article’s assumptions.

The second ceiling is statistical and softer, but it bites earlier. Defects arrive on a wafer at some density, and the probability that a given die contains none of them falls as its area grows. Feng and Ma, in the cost model they published for multi-chiplet architectures, use the negative binomial form Y(A)=(1+D0Ac)−cY(A) = \left(1 + \frac{D_0 A}{c}\right)^{-c}. with defect density D0D_0 , die area A , and a clustering parameter c that captures the fact that defects are not independently scattered [ 2 ] . The exact parameters matter less than the shape. Yield falls monotonically with area, so cost per good die rises faster than area, and past some size the marginal square millimetre costs more than the function printed on it is…

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