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Published equation contexts

S=kTqln⁡(10)(1+CdepCox)S = \frac{kT}{q}\ln(10)\left(1 + \frac{C_{\mathrm{dep}}}{C_{\mathrm{ox}}}\right)

Why this formula appears here

The reason that fourth side matters can be written down directly. A transistor’s subthreshold swing — how many millivolts of gate voltage it takes to change the drain current by a factor of ten — is well approximated by S=kTqln⁡(10)(1+CdepCox)S = \frac{kT}{q}\ln(10)\left(1 + \frac{C_{\mathrm{dep}}}{C_{\mathrm{ox}}}\right). where CdepC_{\mathrm{dep}} is the capacitance of the depletion region the gate does not fully control and CoxC_{\mathrm{ox}} is the gate’s own oxide capacitance. As CdepC_{\mathrm{dep}} falls toward zero, S falls toward its physical floor of about 60 millivolts per decade at room temperature. Wrapping the gate fully around the channel is, in this equation, a direct attack on CdepC_{\mathrm{dep}} : there is no substrate face left for the depletion region to leak through,…

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qq

Symbol q

q occurs below the fraction bar. The quantity above the bar is divided by this expression; zero is excluded as a denominator.

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CdepC_{\mathrm{dep}}

Symbol C_dep

CdC_dep occurs above the fraction bar. The numerator is divided by the entire denominator below it.

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With a fixed numerator, increasing a nonzero denominator reduces the fraction. Read it with the definitions, units, and assumptions supplied by the article.

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S=kTqln⁡(10)(1+CdepCox),S = \frac{kT}{q}\ln(10)\left(1 + \frac{C_{\mathrm{dep}}}{C_{\mathrm{ox}}}\right),

Equation 6 · Semiconductors

How Advanced Semiconductor Fabrication Actually Works

This equation states an equality: the expressions on both sides have the same value under the article’s assumptions.

The reason that fourth side matters can be written down directly. A transistor’s subthreshold swing — how many millivolts of gate voltage it takes to change the drain current by a factor of ten — is well approximated by S=kTqln⁡(10)(1+CdepCox)S = \frac{kT}{q}\ln(10)\left(1 + \frac{C_{\mathrm{dep}}}{C_{\mathrm{ox}}}\right). where CdepC_{\mathrm{dep}} is the capacitance of the depletion region the gate does not fully control and CoxC_{\mathrm{ox}} is the gate’s own oxide capacitance. As CdepC_{\mathrm{dep}} falls toward zero, S falls toward its physical floor of about 60 millivolts per decade at room temperature. Wrapping the gate fully around the channel is, in this equation, a direct attack on CdepC_{\mathrm{dep}} : there is no substrate face left for the depletion region to leak through,…

Meanings in this article

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