Equation 2 · When the Substrate Became the Product
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the defect density. Read the equation part by part below; each part has a contextual explanation and a link to its mathematical background.
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subscript
subscript
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What the article says around this equation
with defect density , die area A , and a clustering parameter c that captures the fact that defects are not independently scattered [ 2 ] . The exact parameters matter less than the shape. Yield falls monotonically with area, so cost per good die rises faster than area, and past some size the marginal square millimetre costs more than the function printed on it is worth. Feng and Ma note that the reason this became urgent is that two trends met: process improvement slowed while chip area approached the reticle limit, so the historical route to more transistors per part closed from both ends.
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