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Equation 15 · Part 3 · Patterning at the Limit: What Actually Happens When a Chip Is Manufactured

Symbol S

Y=(1+DSc)−c,Y = \left(1 + \frac{D S}{c}\right)^{-c},
SS

What this part means

the die area.

Its job in the formula

S occurs above the fraction bar. The numerator is divided by the entire denominator below it.

Where the article explains it

with D the defect density, S the die area, and c a cluster parameter [ 16 ] .

The passage around this formula

Yield modelling then converts defect density into economics. The widely used negative binomial form is Y=(1+DSc)−cY = \left(1 + \frac{D S}{c}\right)^{-c}. with D the defect density, S the die area, and c a cluster parameter [ 16 ] . As c →\to ∞\infty the expression tends to the Poisson model Y = e−DSe^{-D S} , which assumes defects fall independently and uniformly.

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Learn the underlying idea

A variable is a named place for a value. Its letter is a local label: x can mean position in one formula and a data point in another.

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Sources cited in the surrounding passage

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