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Equation 15 · Part 1 · Patterning at the Limit: What Actually Happens When a Chip Is Manufactured

Symbol Y

Y=(1+DSc)−c,Y = \left(1 + \frac{D S}{c}\right)^{-c},
YY

What this part means

the widely used negative binomial form.

Its job in the formula

Y is part of the quantity the equation computes from the expression on the right.

Where the article explains it

The widely used negative binomial form is

The passage around this formula

Yield modelling then converts defect density into economics. The widely used negative binomial form is Y=(1+DSc)−cY = \left(1 + \frac{D S}{c}\right)^{-c}. with D the defect density, S the die area, and c a cluster parameter [ 16 ] . As c →\to ∞\infty the expression tends to the Poisson model Y = e−DSe^{-D S} , which assumes defects fall independently and uniformly.

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A variable is a named place for a value. Its letter is a local label: x can mean position in one formula and a data point in another.

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Sources cited in the surrounding passage

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