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Equation 2 · Part 1 · Advanced Semiconductor Fabrication in Practice: An Advanced Technical Guide

Symbol D_0

D0D_0
D0D_0

What this part means

D0D_0 is a part of this expression. Its role is fixed by the surrounding article and by the operations shown in the formula.

Its job in the formula

D0D_0 is a part of this expression. Its role is fixed by the surrounding article and by the operations shown in the formula.

The passage around this formula

A finished, fully-processed 300-millimeter wafer at an advanced node carries somewhere in the neighborhood of several hundred to a few thousand individual dies, and not all of them will work. The simplest model process engineers reach for treats random defects as a Poisson process across the wafer: given an average defect density D0D_0 (critical defects per unit area) and a die’s critical area AcA_c (the area within which a defect is actually fatal to that die’s function), the expected fraction of working die is

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A subscript is a label attached below a symbol. It often selects a time step, component, category, or member of a sequence.

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